Title :
A Low-Power CMOS Voltage Reference Circuit Based On Subthreshold Operation
Author :
Chang, Chia-Wei ; Lo, Tien-Yu ; Chen, Chia-Min ; Wu, Kuo-Hsi ; Hung, Chung-Chih
Author_Institution :
Infrastructure Res. Dev. Center, Faraday Technol. Corp., Hsinchu
Abstract :
A low power CMOS voltage reference circuit was designed and implemented by TSMC 0.18-mum CMOS process. The voltage reference circuit uses the VGS difference between two MOSFETs operating in the weak-inversion region to generate the voltage with positive temperature coefficient. The reference voltage can be obtained by combining the weighted VGS difference with weak-inversion VGS voltage, which has a negative temperature coefficient. This circuit provides a nominal reference voltage of 621 mV, a temperature coefficient of 11.5 ppm/degC in [-20degC~120degC] from a 1.5 V supply voltage. The line regulation of the reference voltage is 6 mV/V when the supply voltage is increased from 1.5 V to 3 V. The chip area is 0.132 mm2 and dissipates 17.25 muW at room temperature. By connecting a 0.22 muF loading capacitor, the measured noise density at 100 Hz and 100 kHz is 0.14 muV/radicHz and 22.2 muV/radicHz, respectively.
Keywords :
CMOS integrated circuits; reference circuits; voltage control; 0.18 micron; 0.22 muF; 1.5 to 3 V; 17.25 muW; 621 mV; CMOS process; CMOS voltage reference circuit; MOSFET; negative temperature coefficient; positive temperature coefficient; subthreshold operation; weak-inversion region; CMOS process; Capacitors; Circuits; Density measurement; Joining processes; Low voltage; MOSFETs; Noise measurement; Semiconductor device measurement; Temperature;
Conference_Titel :
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location :
New Orleans, LA
Print_ISBN :
1-4244-0920-9
Electronic_ISBN :
1-4244-0921-7
DOI :
10.1109/ISCAS.2007.377877