Title :
Incremental logic rectification
Author :
Huang, Shi-Yu ; Chen, Kuang-Chien ; Cheng, Kwang-Ting
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
fDate :
27 Apr-1 May 1997
Abstract :
We address the problem of rectifying an incorrect combinational circuit against a given specification. Based on the symbolic BDD techniques, we consider the rectification process as a sequence of partial corrections. Each partial correction reduces the size of the input vector set producing error responses. Compared with existing approaches, this approach is more general, and able to handle circuits with multiple errors. We also formulate the necessary and sufficient condition of general single-gate correction to achieve better results for some circuits with a single error. To handle larger circuits, we develop a hybrid approach that makes use of the information of structural correspondence between specification and implementation. Experimental results on industrial examples as well as ISCAS85 benchmark circuits are presented to show the effectiveness of our approach
Keywords :
Boolean functions; VLSI; automatic testing; combinational circuits; error correction; fault diagnosis; logic CAD; logic testing; ISCAS85 benchmark circuits; VLSI design; circuits with multiple errors; error region pruning; general single-gate correction; hybrid approach; implementation; incorrect combinational circuit; incremental logic rectification; sequence of partial corrections; specification; structural correspondence; symbolic BDD techniques; Binary decision diagrams; Circuits; Debugging; Design optimization; Error correction; Hardware design languages; Logic design; Process design; Time measurement; Very large scale integration;
Conference_Titel :
VLSI Test Symposium, 1997., 15th IEEE
Conference_Location :
Monterey, CA
Print_ISBN :
0-8186-7810-0
DOI :
10.1109/VTEST.1997.599466