Title :
Deterministic DEM DAC Performance Analysis
Author :
Jiang, Hanjun ; Chen, Degang ; Geiger, Randall L.
Author_Institution :
Inst. of Microelectron., Tsinghua Univ., Beijing
Abstract :
A rigorous and complete analysis of the deterministic DEM (DDEM) DAC performance is presented. With this analysis, DDEM DAC´s equivalent linearity as ADC static linearity test stimulus source can be precisely predicted. Simulation result is given to validate this theoretical analysis.
Keywords :
built-in self test; digital-analogue conversion; ADC static linearity; built-in self-test; deterministic DEM DAC; deterministic dynamic element matching; digital-to-analog converter; equivalent linearity; test stimulus source; Analytical models; Automatic testing; Built-in self-test; Computational modeling; Computer errors; Costs; Linearity; Performance analysis; Predictive models; Quantization; ADC; Deterministic DEM DAC; built-in self-test; equivalent linearity;
Conference_Titel :
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location :
New Orleans, LA
Print_ISBN :
1-4244-0920-9
Electronic_ISBN :
1-4244-0921-7
DOI :
10.1109/ISCAS.2007.377881
