DocumentCode
2906856
Title
A Fully Programmable Analog Window Comparator
Author
Xiao, Rui ; Laknaur, Amit ; Wang, Haibo
Author_Institution
Dept. of Electr. & Comput. Eng., Southern Illinois Univ. Carbondale, IL
fYear
2007
fDate
27-30 May 2007
Firstpage
3872
Lastpage
3875
Abstract
This paper presents a novel design of analog window comparator circuit. The comparator can adaptively adjust its error threshold according to the magnitude of input signal levels. In addition, the circuit can be digitally programmed to realize different error threshold adapting schemes. The design is fabricated using a 0.18mum CMOS technology. Testing results of the fabricated chip are also presented.
Keywords
CMOS analogue integrated circuits; comparators (circuits); integrated circuit design; programmable circuits; 0.18 micron; CMOS technology; error threshold adapting schemes; fully programmable analog window comparator; CMOS technology; Circuit faults; Circuit testing; Computer errors; Electrical fault detection; Inverters; Logic; Monitoring; Switches; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location
New Orleans, LA
Print_ISBN
1-4244-0920-9
Electronic_ISBN
1-4244-0921-7
Type
conf
DOI
10.1109/ISCAS.2007.377884
Filename
4253527
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