DocumentCode
2906895
Title
Detecting sensor and insulin infusion set anomalies in an artificial pancreas
Author
Baysal, Nihat ; Cameron, Fraser ; Buckingham, Bruce A. ; Wilson, Darrell M. ; Bequette, B. Wayne
Author_Institution
Rensselaer Polytech. Inst., Troy, NY, USA
fYear
2013
fDate
17-19 June 2013
Firstpage
2929
Lastpage
2933
Abstract
Continuous subcutaneous insulin infusion pumps and continuous glucose monitors enable individuals with type 1 diabetes to achieve tighter blood glucose control, and are critical components in a closed-loop artificial pancreas. Insulin infusion sets can fail and CGM sensor signals can suffer from a variety of anomalies. In this paper algorithms are developed to detect infusion set failures and sensor signal anomalies; both in-patient and out-patient studies are presented. A threshold-based method, based on high glucose concentrations, is shown to be adequate to detect infusion set failures. Pressure-induced sensor attenuation (PISA), which can occur when a subject rolls over and puts pressure on their sensor, is a particularly challenging problem. An algorithm based on non-physiological rates-of-change, coupled with a maximum attenuation time window, is developed to detect and compensate for PISAs. These algorithms can be used either in advisory mode for current open-loop technology, as well as an additional safety/fault detection layer as part of a fully closed-loop artificial pancreas.
Keywords
biosensors; CGM sensor signals; blood glucose control; closed loop artificial pancreas; continuous glucose monitors; continuous subcutaneous insulin infusion pumps; insulin infusion set anomalies; insulin infusion sets; maximum attenuation time window; nonphysiological rates of change; open loop technology; pressure induced sensor attenuation; safety/fault detection layer; sensor signal anomalies; threshold based method; Attenuation; Diabetes; Insulin; Monitoring; Pancreas; Real-time systems; Sugar;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference (ACC), 2013
Conference_Location
Washington, DC
ISSN
0743-1619
Print_ISBN
978-1-4799-0177-7
Type
conf
DOI
10.1109/ACC.2013.6580279
Filename
6580279
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