Title :
Extensive SEU impact analysis of a PIC microprocessor for selective hardening
Author :
Valderas, Mario García ; García, Marta Portela ; López, Celia ; Entrena, Luis
Author_Institution :
Electron. Technol. Dept., Univ. Carlos III of Madrid, Leganés, Spain
Abstract :
In order to increase the robustness of a circuit against SEUs, fault injection is commonly used to locate weak areas. Autonomous emulation is used to locate weak areas in a PIC18 microprocessor, while it executes three different workloads.
Keywords :
fault diagnosis; microcontrollers; peripheral interfaces; radiation hardening (electronics); PIC microprocessor; SEU impact analysis; autonomous emulation; fault injection; selective hardening; Circuit faults; Clocks; Emulation; Flip-flops; Microprocessors; Radiation detectors; Random access memory; FPGA-emulation; Fault Injection; SEU;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on
Conference_Location :
Bruges
Print_ISBN :
978-1-4577-0492-5
Electronic_ISBN :
0379-6566
DOI :
10.1109/RADECS.2009.5994670
