Title :
Substrate-noise and random-fluctuations reduction with self-adjusted forward body bias
Author :
Komatsu, Yoshihide ; Ishibashi, Koichiro ; Yamamoto, Masaharu ; Tsukada, Toshiro ; Shimazaki, Kenji ; Fukazawa, Mitsuya ; Nagata, Makoto
Author_Institution :
Semicond. Technol. Acad. Res. Center, Yokohama, Japan
Abstract :
We propose a method of reducing substrate noise and random fluctuations utilizing a self-adjusted forward body bias (SA-FBB) circuit. To achieve this, we designed a test chip that contained an on-chip oscilloscope for detecting dynamic noise from various frequency noise sources, and another test chip that contained 10-M transistors for measuring random fluctuation tendencies. Under SA-FBB conditions, it reduced noise by 69.8% and reduced random fluctuations σ(Ids) by 57.9%.
Keywords :
integrated circuit design; integrated circuit noise; integrated circuit testing; 130 mm; 90 nm; dynamic noise detection; on-chip oscilloscope; random fluctuation reduction; self-adjusted forward body bias circuit; substrate noise reduction; test chip; Circuit noise; Circuit simulation; Circuit testing; Dynamic voltage scaling; Fluctuations; Frequency; Noise measurement; Noise reduction; Semiconductor device noise; Substrates;
Conference_Titel :
Custom Integrated Circuits Conference, 2005. Proceedings of the IEEE 2005
Print_ISBN :
0-7803-9023-7
DOI :
10.1109/CICC.2005.1568601
