Fault Diagnosis of Analog Circuits Based on Adaptive Test and Output Characteristics

Author

Miura, Yukiya ; Kato, Jiro

Author_Institution

Graduate Sch. of Syst. Design, Tokyo Metropolitan Univ.

fYear

2006

fDate

4-6 Oct. 2006

Firstpage

410

Lastpage

418

Abstract

A method for diagnosing analog circuits that is realized by combining the operation-region model and the X-Y zoning method have been proposed. In the method, the authors cloud implement a diagnosis procedure based on a diagnostic method for digital circuits. In this paper, the method by using an adaptive test to obtain a shorter diagnostic sequence length was improved and its characteristics were shown. Moreover, a new data processing method that utilizes the output response of a circuit to obtain better diagnostic performance was proposed. The effectiveness of the proposed methods by applying them to ITC´97 benchmark circuits was demonstrated with hard faults and soft faults. These improved methods can reduce a diagnostic sequence length without degrading the performance of diagnostic resolution and CPU time

Keywords

analogue circuits; circuit testing; fault diagnosis; ITC´97; adaptive test; analog circuits; data processing; fault diagnosis; hard faults; output characteristics; shorter diagnostic sequence; soft faults; Analog circuits; Benchmark testing; Central Processing Unit; Circuit faults; Circuit testing; Clouds; Data processing; Degradation; Digital circuits; Fault diagnosis;

fLanguage

English

Publisher

ieee

Conference_Titel

Defect and Fault Tolerance in VLSI Systems, 2006. DFT '06. 21st IEEE International Symposium on

Conference_Location

Arlington, VA

ISSN

1550-5774

Print_ISBN

0-7695-2706-X

Type

conf

DOI

10.1109/DFT.2006.30

Filename

4030953