Auto-referenced on-die power supply noise measurement circuit

Author

Chansungsan, Chaiyuth

Author_Institution

Intel Corp., Hillsboro, OR, USA

fYear

2005

fDate

18-21 Sept. 2005

Firstpage

39

Lastpage

42

Abstract

An accurate, cost-effective, convenient and high-bandwidth on-die power supply noise measurement circuit is presented. The circuit is auto-referenced, thus saving the cost of an extra power supply for reference and making measurement on a real platform convenient. It is also capable of selectively detecting noises from different bands of frequency spectrum, each due to a different resonance peak in the power delivery network, thus allowing characterization of the noises. The circuit is implemented in a 0.13μm process as part of a PCI-Express link. The noise measurement range is ±105mV with measured 15-mV resolution, and 1ns pulse bandwidth.

Keywords

electric noise measurement; integrated circuit noise; power supply circuits; 0.13 micron; 1 ns; 15 mV; PCI-Express link; noise characterization; on-die power supply noise measurement circuit; power delivery network; resonance peak; Circuit noise; Circuit simulation; Detectors; Frequency; Noise measurement; Packaging; Pollution measurement; Power supplies; Semiconductor device measurement; Working environment noise;

fLanguage

English

Publisher

ieee

Conference_Titel

Custom Integrated Circuits Conference, 2005. Proceedings of the IEEE 2005

Print_ISBN

0-7803-9023-7

Type

conf

DOI

10.1109/CICC.2005.1568602

Filename

1568602