Title :
Process development on the monolithic fabrication of an ultra-compact 4×4 optical switch matrix on InP-InGaAsP material
Author :
Qian, Y.H. ; Owen, M. ; Bryce, A.C. ; Marsh, J.H. ; Wilkinson, C.D.W. ; Penty, R.V. ; White, I.H. ; Perrin, S. ; Rogers, D. ; Robertson, M.
Author_Institution :
Dept. of Electron. & Electr. Eng., Glasgow Univ., UK
Abstract :
We have fabricated an ultra-compact 4×4 optical matrix on InP/InGaAsP material. 1×4 MMI couplers and TIR mirrors are employed to produce a compact 1×2 mm2 device. A CH4/H2/O2 RIE dry etch process has been used to realize two-level dry etching: deep-etch for both the MMI couplers and the mirrors and shallow-etch for the rest of the routing waveguides. It was found that a metal/dielectric bilayer mask is essential for multi-dry-etch processes and high vertical profile. We have found a Ti intermediate mask for the deep-etch process which is removable by SF6 dry-etch before the following shallow process. Dry-etch removal of the intermediate mask is necessary to protect the deep-etched mirror sidewall
Keywords :
III-V semiconductors; etching; gallium arsenide; gallium compounds; indium compounds; integrated optoelectronics; masks; mirrors; optical couplers; optical fabrication; optical switches; optical waveguides; semiconductor technology; 1×4 MMI couplers; CH4/H2/O2 RIE dry etch process; InP-InGaAsP; InP/InGaAsP material; MMI couplers; SF6; SF6 dry-etch; TIR mirrors; Ti intermediate mask; deep-etched mirror sidewall; high profile; high vertical profile; intermediate mask; metal/dielectric bilayer mask; mirrors; monolithic fabrication; multi-dry-etch processes; process development; routing waveguides; shallow process; shallow-etch; two-level dry etching; ultra-compact 4×4 optical switch matrix; Couplers; Dry etching; Indium phosphide; Mirrors; Optical device fabrication; Optical devices; Optical materials; Optical waveguides; Routing; Transmission line matrix methods;
Conference_Titel :
Indium Phosphide and Related Materials, 1999. IPRM. 1999 Eleventh International Conference on
Conference_Location :
Davos
Print_ISBN :
0-7803-5562-8
DOI :
10.1109/ICIPRM.1999.773645