Title :
Fault tolerant FIR filters using hamming codes
Author :
Liu, Shih-Fu ; Reviriego, Pedro ; Maestro, Juan Antonio
Author_Institution :
Univ. Antonio de Nebrija, Madrid, Spain
Abstract :
Hamming Codes have been used to protect different circuits against Single Event Upsets (SEUs). In this paper, the use of Hamming on FIR Filters is studied in order to provide optimized and efficient protection techniques.
Keywords :
FIR filters; Hamming codes; fault tolerance; Hamming code; SEU; fault tolerant FIR filter; single event upset; Application specific integrated circuits; Decoding; Field programmable gate arrays; Finite impulse response filter; Logic gates; Table lookup; Tunneling magnetoresistance; Digital filters; Hamming codes; Reliability; Single Event Upset (SEU);
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on
Conference_Location :
Bruges
Print_ISBN :
978-1-4577-0492-5
Electronic_ISBN :
0379-6566
DOI :
10.1109/RADECS.2009.5994701
