Title :
A wafer level encapsulated FBAR chip molded into a 2.0 mm × 1.6 mm plastic package for use as a PCS full band Tx filter
Author :
Feld, David ; Bradley, Paul ; Barfknecht, Andrew ; Ruby, Richard
Author_Institution :
Wireless Semicond. Div., Agilent Technol. Inc., San Jose, CA, USA
Abstract :
A high performance 2.0 mm × 1.6 mm × 1.0 mm full band filter is demonstrated. The small filter size is achieved by: 1) encapsulating the die in a chip scale hermetic package; and by 2) molding that chip scale package into a plastic chip-on-board package. This new packaging scheme reduces the filter cost and allows for further size reduction. The filter has a minimum insertion loss of ∼ 1 dB, is guaranteed to have a 3.5 dB worst-case insertion loss in the Tx band (1850-1910 MHz), and typically exhibits 35 dB of rejection in the Rx band (1930-1990 MHz). The filter comprises high-Q FBAR resonators that enable it to make a sub-10 MHz transition from the pass to stop band. Hence the required rolloff within the 20 MHz (1%) guard band can be achieved while accounting for both manufacturing variations and operating temperature drifts. The filter achieves ∼ 25 dB of rejection at the second harmonic (3700-3820 MHz) and typically 15 dB of rejection at the third harmonic (5550-5730 MHz).
Keywords :
acoustic resonators; bulk acoustic wave devices; chip-on-board packaging; encapsulation; plastic packaging; radiofrequency filters; wafer bonding; 1.0 mm; 1.6 mm; 1850 to 1910 MHz; 1930 to 1990 MHz; 2.0 mm; 3700 to 3820 MHz; 5550 to 5730 MHz; FBAR chip; PCS full band transmitter filter; chip scale hermetic package; guard band; insertion loss; operating temperature drifts; plastic chip-on-board package; plastic package; size reduction; wafer level encapsulation; Band pass filters; Chip scale packaging; Costs; Film bulk acoustic resonators; Insertion loss; Personal communication networks; Plastic packaging; Power harmonic filters; Resonator filters; Wafer scale integration;
Conference_Titel :
Ultrasonics, 2003 IEEE Symposium on
Print_ISBN :
0-7803-7922-5
DOI :
10.1109/ULTSYM.2003.1293262