DocumentCode :
2907686
Title :
Heavy ion testing at the galactic cosmic ray energy peak
Author :
Pellish, Jonathan A. ; Xapsos, Michael A. ; LaBel, Kenneth A. ; Marshall, Paul W. ; Heidel, David F. ; Rodbell, Kenneth P. ; Hakey, Mark C. ; Dodd, Paul E. ; Shaneyfelt, Marty R. ; Schwank, James R. ; Baumann, Robert C. ; Deng, Xiaowei ; Marshall, Andrew
Author_Institution :
Radiat. Effects & Anal. Group, NASA/GSFC, Greenbelt, MD, USA
fYear :
2009
fDate :
14-18 Sept. 2009
Firstpage :
559
Lastpage :
562
Abstract :
A 1 GeV/u 56Fe ion beam allows for true 90° tilt irradiations of various microelectronic components and reveals relevant upset trends for an abundant element at the GCR flux energy peak.
Keywords :
galactic cosmic rays; integrated circuit testing; ion beams; ions; iron; Fe; galactic cosmic ray energy peak; heavy ion testing; ion beam; microelectronic components; tilt irradiations; CMOS integrated circuits; Field programmable gate arrays; Laboratories; NASA; Radiation effects; Random access memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on
Conference_Location :
Bruges
ISSN :
0379-6566
Print_ISBN :
978-1-4577-0492-5
Electronic_ISBN :
0379-6566
Type :
conf
DOI :
10.1109/RADECS.2009.5994714
Filename :
5994714
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2907686
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