• DocumentCode
    2907982
  • Title

    ATMEL ATF280E rad hard SRAM based reprogrammable FPGA SEE test results

  • Author

    Mantelet, Guy ; Briet, Michel ; Rouxel, Guy ; Hachad, Said ; Bancelin, Bernard ; de saint Roman, Dominique

  • Author_Institution
    ATMEL Nantes, Nantes, France
  • fYear
    2009
  • fDate
    14-18 Sept. 2009
  • Firstpage
    606
  • Lastpage
    608
  • Abstract
    The paper presents the new ATMEL rad-hard SRAM based reprogrammable FPGA design choices as well as the SEE (Single Event Effect) test results to illustrate the capability of this product to be used in space.
  • Keywords
    SRAM chips; field programmable gate arrays; integrated circuit testing; logic design; ATMEL ATF280E rad hard SRAM; FPGA design; SEE test; reprogrammable FPGA SEE test; single event effect test; Computer architecture; Field programmable gate arrays; Microprocessors; Radiation hardening; Random access memory; Single event upset; Transient analysis; LET; Single Event Latchup (SEL); Single Event Transient (SET); Single Event Upset (SEU);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on
  • Conference_Location
    Bruges
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4577-0492-5
  • Electronic_ISBN
    0379-6566
  • Type

    conf

  • DOI
    10.1109/RADECS.2009.5994730
  • Filename
    5994730
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2907982