• DocumentCode
    2908180
  • Title

    The importance of including thermal effects in estimating the effectiveness of power reduction techniques

  • Author

    Ku, Ja Chun ; Ghoneima, Maged ; Ismail, Yehea

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Northwestern Univ., Evanston, IL
  • fYear
    2005
  • fDate
    21-21 Sept. 2005
  • Firstpage
    301
  • Lastpage
    304
  • Abstract
    It is shown in this paper that thermal effects have to be an integral part of estimating the effectiveness of power reduction techniques in nanometer scale technologies, and its inclusion always results in higher reduction in power than conventional estimations. Four different power reduction techniques for on-chip buses are used as examples to show the necessity of including thermal effects. Simulation results in a 70nm technology show that thermal-aware estimations of power savings are 17-38% higher than conventional estimations that do not include thermal effects
  • Keywords
    low-power electronics; nanoelectronics; system-on-chip; thermal analysis; 70 nm; higher reduction; nanometer scale technology; on-chip buses; power reduction technique; power savings; thermal effects; thermal-aware estimation; Delay; Design methodology; Design optimization; Electromigration; Energy consumption; Integrated circuit technology; Subthreshold current; Temperature dependence; Threshold voltage; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2005. Proceedings of the IEEE 2005
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7803-9023-7
  • Type

    conf

  • DOI
    10.1109/CICC.2005.1568665
  • Filename
    1568665