DocumentCode
2908234
Title
Effect of Base Width and Implantation Dose on Performance of 3-Terminal Magnetotransistor
Author
Woradet, Jaroenmit ; Phetchakul, Toempong ; Chareankid, Sompong ; Pengchan, Weera ; Klunngien, Nipapan ; Hruanun, Charndet ; Poyai, Amporn
Author_Institution
Thai Microelectron. Center, Amphur Muang Chachoengsao
fYear
2007
fDate
26-28 Sept. 2007
Firstpage
41
Lastpage
44
Abstract
This paper presents the effect of base width and implantation dose on electrical carriers in the magnetotransistor deflected by the Lorentz force (FL) from magnetic field. The structure of magnetotransistor is designed like a structure of a PNP bipolar junction transistor which comprises of 3 terminals, i.e., emitter, collector and base. The base width (L) is varied (10, 20 and 30 mum) where the spacing between collector and base is fixed at 40 mum. The emitter and collector regions are doped with boron (BF2) at the dose of 3times1015, 5times1015 and 1times1016 ions/cm2. It is found that the sensitivity is increased when increasing L and the implantation dose. It is also demonstrated that the linear relationship between the output voltage of the magnetotransistor circuit and magnetic field can be obtained.
Keywords
magnetic fields; transistor circuits; 3-terminal magnetotransistor; Lorentz force; base width; electrical carrier; emitter; implantation dose; magnetic field; magnetotransistor circuit; output voltage; Boron; Charge carrier processes; Electron emission; Lorentz covariance; Magnetic circuits; Magnetic devices; Magnetic fields; Magnetic sensors; Microelectronics; Packaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Circuits, 2007. ISIC '07. International Symposium on
Conference_Location
Singapore
Print_ISBN
978-1-4244-0797-2
Electronic_ISBN
978-1-4244-0797-2
Type
conf
DOI
10.1109/ISICIR.2007.4441791
Filename
4441791
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