• DocumentCode
    2908234
  • Title

    Effect of Base Width and Implantation Dose on Performance of 3-Terminal Magnetotransistor

  • Author

    Woradet, Jaroenmit ; Phetchakul, Toempong ; Chareankid, Sompong ; Pengchan, Weera ; Klunngien, Nipapan ; Hruanun, Charndet ; Poyai, Amporn

  • Author_Institution
    Thai Microelectron. Center, Amphur Muang Chachoengsao
  • fYear
    2007
  • fDate
    26-28 Sept. 2007
  • Firstpage
    41
  • Lastpage
    44
  • Abstract
    This paper presents the effect of base width and implantation dose on electrical carriers in the magnetotransistor deflected by the Lorentz force (FL) from magnetic field. The structure of magnetotransistor is designed like a structure of a PNP bipolar junction transistor which comprises of 3 terminals, i.e., emitter, collector and base. The base width (L) is varied (10, 20 and 30 mum) where the spacing between collector and base is fixed at 40 mum. The emitter and collector regions are doped with boron (BF2) at the dose of 3times1015, 5times1015 and 1times1016 ions/cm2. It is found that the sensitivity is increased when increasing L and the implantation dose. It is also demonstrated that the linear relationship between the output voltage of the magnetotransistor circuit and magnetic field can be obtained.
  • Keywords
    magnetic fields; transistor circuits; 3-terminal magnetotransistor; Lorentz force; base width; electrical carrier; emitter; implantation dose; magnetic field; magnetotransistor circuit; output voltage; Boron; Charge carrier processes; Electron emission; Lorentz covariance; Magnetic circuits; Magnetic devices; Magnetic fields; Magnetic sensors; Microelectronics; Packaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Circuits, 2007. ISIC '07. International Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-0797-2
  • Electronic_ISBN
    978-1-4244-0797-2
  • Type

    conf

  • DOI
    10.1109/ISICIR.2007.4441791
  • Filename
    4441791