Title :
Lifetime analysis of aluminum electrolytic capacitor subject to voltage fluctuations
Author :
Zhao, Kun ; Ciufo, Philip ; Perera, Sarath
Author_Institution :
Sch. of Electr., Comput. & Telecommun. Eng., Univ. of Wollongong, Wollongong, NSW, Australia
Abstract :
This paper evaluates the changes in the ripple current for an electrolytic capacitor used in the dc-side of a single-phase rectifier circuit when subjected to input voltage fluctuations. The study has been undertaken in order to analyse the potential impact on capacitor lifetime. The key effect is that the capacitor ripple current, as a consequence of voltage fluctuations, increases dramatically and this phenomenon keeps deteriorating as the frequency of the voltage fluctuations increases. Simulations and experimental work confirm this phenomenon. Since the power loss and temperature rise are dependent on the capacitor equivalent series resistance (ESR) and ripple current components, an increase in ripple current under voltage fluctuation conditions is likely to accelerate this process, resulting in a reduced lifetime.
Keywords :
electrolytic capacitors; power supply quality; rectifiers; aluminum electrolytic capacitor; capacitor equivalent series resistance; capacitor ripple current; lifetime analysis; power loss; single-phase rectifier circuit; temperature rise; voltage fluctuations; Capacitors; Frequency modulation; Impedance; Power supplies; Temperature; Voltage fluctuations; ESR; Voltage fluctuation; electrolytic capacitor; flicker; rectifier current ripple;
Conference_Titel :
Harmonics and Quality of Power (ICHQP), 2010 14th International Conference on
Conference_Location :
Bergamo
Print_ISBN :
978-1-4244-7244-4
Electronic_ISBN :
978-1-4244-7245-1
DOI :
10.1109/ICHQP.2010.5625486