A System for the Measurement of the Temperature Dependence Performances of Quartz Oscillators: a Study of the Analytical Model of the Failure Rate

This paper presents a method of investigation of the temperature dependence of the accuracy performances of quartz oscillators. Temperature effects may vary widely in significance depending on the environment. Quartz can be used as high stability oscillators, having oscillation frequencies ranging from few kHz to 20 MHz. A fundamental qualifying parameter is then represented by the frequency stability of the quartz crystal oscillator. For this reason, in this paper, an automatic system for the measurements of the quartz oscillation frequency as a function of changes in temperature, is presented. The system has been designed and realized in our laboratories. The results of the characterization tests and measurements are also reported and discussed.