• DocumentCode
    2908385
  • Title

    An Architecture To Test Random Access Memories

  • Author

    Rajsuman, R.

  • Author_Institution
    Case Western Reserve University
  • fYear
    1992
  • fDate
    4-7 Jan 1992
  • Firstpage
    144
  • Lastpage
    147
  • Keywords
    Built-in self-test; Circuit faults; Circuit testing; Computer architecture; Decoding; Design engineering; Design methodology; Hardware; Random access memory; Read-write memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 1992. Proceedings., The Fifth International Conference on
  • ISSN
    1063-9667
  • Print_ISBN
    0-8186-2465-5
  • Type

    conf

  • DOI
    10.1109/ICVD.1992.658036
  • Filename
    658036
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2908385