DocumentCode :
2908385
Title :
An Architecture To Test Random Access Memories
Author :
Rajsuman, R.
Author_Institution :
Case Western Reserve University
fYear :
1992
fDate :
4-7 Jan 1992
Firstpage :
144
Lastpage :
147
Keywords :
Built-in self-test; Circuit faults; Circuit testing; Computer architecture; Decoding; Design engineering; Design methodology; Hardware; Random access memory; Read-write memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 1992. Proceedings., The Fifth International Conference on
ISSN :
1063-9667
Print_ISBN :
0-8186-2465-5
Type :
conf
DOI :
10.1109/ICVD.1992.658036
Filename :
658036
Link To Document :
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