Algebraic/topological combined strategies for sequential ATPG

Author

Macii, E. ; Meo, A.R.

Author_Institution

Dip. di Autom. e Inf., Politecnico di Torino, Italy

fYear

1991

fDate

4-6 Nov 1991

Firstpage

1240

Abstract

The authors describe an algorithm for automatic test pattern generation for sequential integrated circuits that is based on a combination of algebraic and topological techniques. The algebraic concepts of observability and controllability functions have been applied to an innovative version of the sequential D-algorithm working on the combinational part of the network that has been partitioned into several fanout-free regions. The ideas of observability order, controllability order, and incompatibility function have been introduced in order to improve the ATPG performance. An application example of the proposed algorithm is discussed, and experimental results are presented

Keywords

automatic testing; integrated circuit testing; sequential circuits; algebraic techniques; automatic test pattern generation; combinational network; controllability functions; controllability order; fanout-free regions; incompatibility function; observability function; observability order; sequential ATPG; sequential D-algorithm; sequential integrated circuits; topological techniques; Automatic test pattern generation; Circuit faults; Circuit testing; Integrated circuit technology; Integrated circuit testing; Logic testing; Observability; Performance evaluation; Software testing; Teleprinting;

fLanguage

English

Publisher

ieee

Conference_Titel

Signals, Systems and Computers, 1991. 1991 Conference Record of the Twenty-Fifth Asilomar Conference on

Conference_Location

Pacific Grove, CA

ISSN

1058-6393

Print_ISBN

0-8186-2470-1

Type

conf

DOI

10.1109/ACSSC.1991.186646

Filename

186646