DocumentCode
2908590
Title
Improved pohotoacoustic microscope for the evaluation of metal thin film [pohotoacoustic read photoacoustic]
Author
Minamide, Akiyuki ; Tokunaga, Yoshiaki
Author_Institution
Dept. of Electr. Eng., Kanazawa Tech. Coll., Japan
Volume
2
fYear
2003
fDate
5-8 Oct. 2003
Firstpage
2053
Abstract
The improvement of the photoacoustic microscope for the metal thin film evaluation was described. When a conventional method was used in the photoacoustic microscope, the photoacoustic signal generated from a metal thin film was very weak. To solve this problem, this paper proposed the improved method of using the surface plasmon. In the silver thin film, the improved method was about 20 times more effective than in conventional methods for observing PA signals.
Keywords
acoustic microscopes; acoustic signal processing; metallic thin films; photoacoustic effect; surface plasmons; ultrasonic materials testing; PA signals; metal thin film; photoacoustic microscope; photoacoustic signal; silver thin film; surface plasmon; Microscopy; Optical materials; Plasma measurements; Plasma properties; Plasma transport processes; Plasma waves; Plasmons; Silver; Surface waves; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics, 2003 IEEE Symposium on
Print_ISBN
0-7803-7922-5
Type
conf
DOI
10.1109/ULTSYM.2003.1293322
Filename
1293322
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