Title :
Improved pohotoacoustic microscope for the evaluation of metal thin film [pohotoacoustic read photoacoustic]
Author :
Minamide, Akiyuki ; Tokunaga, Yoshiaki
Author_Institution :
Dept. of Electr. Eng., Kanazawa Tech. Coll., Japan
Abstract :
The improvement of the photoacoustic microscope for the metal thin film evaluation was described. When a conventional method was used in the photoacoustic microscope, the photoacoustic signal generated from a metal thin film was very weak. To solve this problem, this paper proposed the improved method of using the surface plasmon. In the silver thin film, the improved method was about 20 times more effective than in conventional methods for observing PA signals.
Keywords :
acoustic microscopes; acoustic signal processing; metallic thin films; photoacoustic effect; surface plasmons; ultrasonic materials testing; PA signals; metal thin film; photoacoustic microscope; photoacoustic signal; silver thin film; surface plasmon; Microscopy; Optical materials; Plasma measurements; Plasma properties; Plasma transport processes; Plasma waves; Plasmons; Silver; Surface waves; Transistors;
Conference_Titel :
Ultrasonics, 2003 IEEE Symposium on
Print_ISBN :
0-7803-7922-5
DOI :
10.1109/ULTSYM.2003.1293322
