DocumentCode :
2908633
Title :
TSV reduction in homogeneous 3D FPGAs by logic resource and input pad replication
Author :
Moallempour, Seyyed Hasan ; Razavi, Seyyed Ahmad ; Zamani, Morteza Saheb
Author_Institution :
Dept. of Comput. Eng. & IT, Amirkabir Univ. of Technol., Tehran, Iran
fYear :
2012
fDate :
Jan. 31 2012-Feb. 2 2012
Firstpage :
1
Lastpage :
5
Abstract :
One of the major challenges in the process of three-dimensional integrated circuit fabrication is the manufacturing of through silicon vias (TSV). These TSVs compared with other connection elements require high manufacturing costs as well as large silicon area. In this paper, replication technique has been used to reduce the number of TSVs in 3D FPGAs. Replication is implemented for circuit input pads and logic blocks. Experimental results over 20 MCNC benchmarks show 33% and 20% reduction in the number of TSVs and delay on average, respectively, at the cost of 3% more logic blocks and 3% more input pads that they place in the unused resources of FPGA.
Keywords :
field programmable gate arrays; integrated logic circuits; three-dimensional integrated circuits; 3D FPGA; MCNC benchmarks; TSV reduction; delay; input pad replication; logic blocks; logic resource; three-dimensional integrated circuit fabrication process; through silicon vias manufacturing; Benchmark testing; Delay; Field programmable gate arrays; Pins; Routing; Switches; Wires; Replication; Three dimensional FPGA; Through silicon via;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
3D Systems Integration Conference (3DIC), 2011 IEEE International
Conference_Location :
Osaka
Print_ISBN :
978-1-4673-2189-1
Type :
conf
DOI :
10.1109/3DIC.2012.6263033
Filename :
6263033
Link To Document :
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