• DocumentCode
    2908665
  • Title

    Memory circuits and technology

  • Author

    Akioka, T. ; Vial, J.-C.

  • fYear
    2005
  • fDate
    18-21 Sept. 2005
  • Firstpage
    414
  • Lastpage
    415
  • Keywords
    CADCAM; CMOS technology; Circuit stability; Circuit testing; Computer aided manufacturing; Ferroelectric films; Nonvolatile memory; Phase change random access memory; Phased arrays; Random access memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2005. Proceedings of the IEEE 2005
  • Print_ISBN
    0-7803-9023-7
  • Type

    conf

  • DOI
    10.1109/CICC.2005.1568695
  • Filename
    1568695