Title :
Memory circuits and technology
Author :
Akioka, T. ; Vial, J.-C.
Keywords :
CADCAM; CMOS technology; Circuit stability; Circuit testing; Computer aided manufacturing; Ferroelectric films; Nonvolatile memory; Phase change random access memory; Phased arrays; Random access memory;
Conference_Titel :
Custom Integrated Circuits Conference, 2005. Proceedings of the IEEE 2005
Print_ISBN :
0-7803-9023-7
DOI :
10.1109/CICC.2005.1568695
