DocumentCode
2908665
Title
Memory circuits and technology
Author
Akioka, T. ; Vial, J.-C.
fYear
2005
fDate
18-21 Sept. 2005
Firstpage
414
Lastpage
415
Keywords
CADCAM; CMOS technology; Circuit stability; Circuit testing; Computer aided manufacturing; Ferroelectric films; Nonvolatile memory; Phase change random access memory; Phased arrays; Random access memory;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 2005. Proceedings of the IEEE 2005
Print_ISBN
0-7803-9023-7
Type
conf
DOI
10.1109/CICC.2005.1568695
Filename
1568695
Link To Document