Title :
Phase change RAM operated with 1.5-V CMOS as low cost embedded memory
Author :
Osada, K. ; Kawahara, T. ; Takemura, R. ; Kitai, N. ; Takaura, N. ; Matsuzaki, N. ; Kurotsuchi, K. ; Moriya, H. ; Moniwa, M.
Author_Institution :
Central Res. Lab., Hitachi, Ltd., Tokyo, Japan
Abstract :
This paper describes a phase change (PC) RAM operated at the lowest possible voltage, 1.5 V, with a CMOS memory array, using PC material with the lowest RESET current. We discuss the margins for reset/set/read operations based on measurement results and identified that it is impossible to distinguish between reset/set operations by controlling the bit-line voltage. We propose a new tri-level voltage word-line control (3LV-WL) scheme to clearly operate set operations. Moreover, we investigated the read disturb operation and developed a new reduced-actual-read-access (RA2) scheme to attain 500 times the read retention time. We also developed a source line control (SLC) scheme to attain an 18% smaller cell size and a 19-F2 memory cell with enough reset current to clearly reset the PC material. With the application of these approaches, we established reset/set/read operations with the lowest possible voltage, 1.5 V with logic CMOS, for a low-cost embedded memory with a few additional masks.
Keywords :
CMOS memory circuits; embedded systems; phase change materials; random-access storage; 1.5 V; CMOS memory array; bit-line voltage; embedded memory; logic CMOS; memory cell; phase change RAM; phase change material; reset-set-read operations; source line control; tri-level voltage word-line control scheme; Amorphous materials; Costs; Crystalline materials; Laboratories; Phase change random access memory; Phased arrays; Random access memory; Read-write memory; Video recording; Voltage control;
Conference_Titel :
Custom Integrated Circuits Conference, 2005. Proceedings of the IEEE 2005
Print_ISBN :
0-7803-9023-7
DOI :
10.1109/CICC.2005.1568698