• DocumentCode
    2908709
  • Title

    Phase change RAM operated with 1.5-V CMOS as low cost embedded memory

  • Author

    Osada, K. ; Kawahara, T. ; Takemura, R. ; Kitai, N. ; Takaura, N. ; Matsuzaki, N. ; Kurotsuchi, K. ; Moriya, H. ; Moniwa, M.

  • Author_Institution
    Central Res. Lab., Hitachi, Ltd., Tokyo, Japan
  • fYear
    2005
  • fDate
    18-21 Sept. 2005
  • Firstpage
    431
  • Lastpage
    434
  • Abstract
    This paper describes a phase change (PC) RAM operated at the lowest possible voltage, 1.5 V, with a CMOS memory array, using PC material with the lowest RESET current. We discuss the margins for reset/set/read operations based on measurement results and identified that it is impossible to distinguish between reset/set operations by controlling the bit-line voltage. We propose a new tri-level voltage word-line control (3LV-WL) scheme to clearly operate set operations. Moreover, we investigated the read disturb operation and developed a new reduced-actual-read-access (RA2) scheme to attain 500 times the read retention time. We also developed a source line control (SLC) scheme to attain an 18% smaller cell size and a 19-F2 memory cell with enough reset current to clearly reset the PC material. With the application of these approaches, we established reset/set/read operations with the lowest possible voltage, 1.5 V with logic CMOS, for a low-cost embedded memory with a few additional masks.
  • Keywords
    CMOS memory circuits; embedded systems; phase change materials; random-access storage; 1.5 V; CMOS memory array; bit-line voltage; embedded memory; logic CMOS; memory cell; phase change RAM; phase change material; reset-set-read operations; source line control; tri-level voltage word-line control scheme; Amorphous materials; Costs; Crystalline materials; Laboratories; Phase change random access memory; Phased arrays; Random access memory; Read-write memory; Video recording; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2005. Proceedings of the IEEE 2005
  • Print_ISBN
    0-7803-9023-7
  • Type

    conf

  • DOI
    10.1109/CICC.2005.1568698
  • Filename
    1568698