• DocumentCode
    2908732
  • Title

    Application of principal component pursuit to process fault detection and diagnosis

  • Author

    Yue Cheng ; Tongwen Chen

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Alberta, Edmonton, AB, Canada
  • fYear
    2013
  • fDate
    17-19 June 2013
  • Firstpage
    3535
  • Lastpage
    3540
  • Abstract
    Data-driven process monitoring has been extensively discussed in both academia and industry because of its applicability and effectiveness. One of the most applied techniques is the principal component analysis (PCA). Recently a new technique called principal component pursuit (PCP) is introduced. Compared to PCA, PCP is more robust to outliers. In this paper, the application of the PCP technique to process monitoring is thoroughly discussed from training data preprocessing to residual signal post-filtering. A new scaling preprocessing step is proposed to improve quality of data matrices in the sense of low coherence. A residual generator and a post-filter suitable for PCP generated process models are also provided. The post-filtered residual represents the fault signal, which makes the fault detection, isolation and reconstruction procedures simple and straightforward. A numerical example is provided to describe and illustrate the PCP-based process modeling and monitoring procedures.
  • Keywords
    computerised monitoring; data handling; fault diagnosis; filtering theory; principal component analysis; process monitoring; signal processing; PCP generated process model; PCP technique; PCP-based process modeling; PCP-based process monitoring; data matrix quality; data-driven process monitoring; fault detection; fault isolation; fault reconstruction; fault signal; post-filtered residual; principal component pursuit; residual generator; residual signal post-filtering; scaling preprocessing step; training data preprocessing; Coherence; Fault detection; Optimization; Principal component analysis; Sparse matrices; Standards; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference (ACC), 2013
  • Conference_Location
    Washington, DC
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4799-0177-7
  • Type

    conf

  • DOI
    10.1109/ACC.2013.6580378
  • Filename
    6580378