• DocumentCode
    2908780
  • Title

    A soft-error-immune maintenance-free TCAM architecture with associated embedded DRAM

  • Author

    Noda, Hideyuki ; Dosaka, Katsumi ; Morishita, Fukashi ; Arimoto, Kazutami

  • Author_Institution
    Syst. Core Technol. Div., Renesas Technol. Corp., Hyogo, Japan
  • fYear
    2005
  • fDate
    18-21 Sept. 2005
  • Firstpage
    451
  • Lastpage
    454
  • Abstract
    This paper describes a novel TCAM architecture with associated embedded DRAM. The design concept improves the soft error immunity by 6 digits, and also resolves the critical problems of the look-up table maintenance of TCAM. The proposed architecture in this paper is especially attractive for realizing soft-error immune, high-performance TCAM chips.
  • Keywords
    DRAM chips; content-addressable storage; embedded systems; memory architecture; table lookup; TCAM architecture; TCAM chips; embedded DRAM; look-up table; soft error immunity; ternary content addressable memory; Cams; Circuits; Decoding; Degradation; Error correction; Error correction codes; Maintenance; Random access memory; Table lookup; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2005. Proceedings of the IEEE 2005
  • Print_ISBN
    0-7803-9023-7
  • Type

    conf

  • DOI
    10.1109/CICC.2005.1568703
  • Filename
    1568703
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2908780