DocumentCode :
2908842
Title :
Fault-tolerant round robin A/D converter system
Author :
Beckmann, Paul E. ; Musicus, Bruce R.
Author_Institution :
MIT Electron. Res. Lab., Cambridge, MA, USA
fYear :
1990
fDate :
3-6 Apr 1990
Firstpage :
1759
Abstract :
A robust A/D converter system is described which requires much less hardware overhead than traditional modular redundancy approaches. A modest amount of oversampling is used to generate information which can be exploited to achieve fault tolerance. A generalized likelihood ratio test is used to detect the most likely failure and also to estimate the optimum signal reconstruction. The error detection and correction algorithm reduces to a simple form and requires only a slight amount of hardware overhead. A derivation of the algorithm is followed by simulation results
Keywords :
analogue-digital conversion; error correction; error detection; error correction; error detection; fault tolerance; generalized likelihood ratio test; hardware overhead; optimum signal reconstruction; oversampling; round robin A/D converter system; Circuit faults; Error correction; Fault detection; Fault tolerance; Fault tolerant systems; Hardware; Laboratories; Redundancy; Robustness; Round robin; Sampling methods; Signal reconstruction; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Acoustics, Speech, and Signal Processing, 1990. ICASSP-90., 1990 International Conference on
Conference_Location :
Albuquerque, NM
ISSN :
1520-6149
Type :
conf
DOI :
10.1109/ICASSP.1990.115823
Filename :
115823
Link To Document :
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