DocumentCode :
2908946
Title :
Long wavelength GaInAs/GaAs quantum well lasers
Author :
Schlenker, D. ; Miyamoto, T. ; Chen, Z. ; Koyama, F. ; Iga, K.
Author_Institution :
Precision & Intelligence Lab., Tokyo Inst. of Technol., Yokohama, Japan
fYear :
1999
fDate :
1999
Firstpage :
499
Lastpage :
502
Abstract :
We have obtained an excellent performance GaInAs/GaAs laser grown by MOCVD emitting in the long wavelength band (1@1.2 mm). The experimental critical thickness of GaInAs/GaAs quantum wells is well understood by the People and Bean model. The longest wavelength of around 1.2 mm is predicted for these structures. A 1.17 mm double quantum well laser has been demonstrated. We show that a strained buffer layer is effective for achieving good crystal quality for the active region and has no tradeoff on the device performance. For as cleaved devices a transparency current density of 180 A/cm2 is estimated. A 900 mm long device shows a characteristic temperature as high as 150 K. Continuous wave operation is achieved for a ridge waveguide laser diode emitting at 1.2 mm
Keywords :
III-V semiconductors; current density; gallium arsenide; indium compounds; quantum well lasers; ridge waveguides; transparency; 1.2 mm; GaInAs-GaAs; MOCVD; active region; characteristic temperature; continuous wave operation; critical thickness; crystal quality; device performance; double quantum well laser; long wavelength GaInAs/GaAs quantum well lasers; ridge waveguide laser diode; strained buffer layer; transparency current density; Buffer layers; Fiber lasers; Gallium arsenide; Indium; Laser modes; Optical materials; Quantum well lasers; Surface emitting lasers; Temperature; Vertical cavity surface emitting lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 1999. IPRM. 1999 Eleventh International Conference on
Conference_Location :
Davos
ISSN :
1092-8669
Print_ISBN :
0-7803-5562-8
Type :
conf
DOI :
10.1109/ICIPRM.1999.773742
Filename :
773742
Link To Document :
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