DocumentCode :
2909066
Title :
The hidden crisis in test effectiveness
Author :
Scully, John K.
Author_Institution :
JKS Syst. Ltd., Westlake Village, CA, USA
fYear :
1998
fDate :
24-27 Aug 1998
Firstpage :
59
Lastpage :
66
Abstract :
The sophistication and complexity of avionic, and other, prime systems has been growing at a pace that has not been matched by commensurate improvements in test technology. The result is NFF (no fault found) and other test effectiveness deficiencies that will soon, if they have not already, reach crisis levels. This pending crisis is all the more serious because it tends to be hidden by a variety of technical, administrative and commercial factors that often mask the real problems, and that sometimes even hinder the measures needed to correct them. Corrective action requires recognition of the true nature of test effectiveness deficiencies, the paradigms and processes with which they are associated, and the changes required to keep pace with modern prime system technology, maintenance requirements and safety objectives
Keywords :
automatic test equipment; avionics; built-in self test; economics; electronic equipment testing; production testing; administrative factors; avionic; commercial factors; maintenance; no fault found; safety objectives; technical factors; test effectiveness; test technology; Aerospace electronics; Circuit faults; Circuit testing; Costs; Event detection; Fault detection; Software safety; Software testing; System testing; Terminology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '98. IEEE Systems Readiness Technology Conference., 1998 IEEE
Conference_Location :
Salt Lake City, UT
ISSN :
1088-7725
Print_ISBN :
0-7803-4420-0
Type :
conf
DOI :
10.1109/AUTEST.1998.713421
Filename :
713421
Link To Document :
بازگشت