مرکز منطقه ای اطلاع رساني علوم و فناوري - Scanning Tunneling Microscopy of the Si-Mosfet Used for Quantized Hall Resistance Measurements

DocumentCode :

2909100

Title :

Scanning Tunneling Microscopy of the Si-Mosfet Used for Quantized Hall Resistance Measurements

Author :

Khaikin, M.S. ; Edel´man, V.S. ; Troyanovskii, A.M. ; Pudalov, V.M. ; Semenchinsky, S.G.

Author_Institution :

Institute for Physical Problems, Academy of Sciences of the USSR

fYear :

1988

fDate :

7-10 June 1988

Firstpage :

325

Lastpage :

326

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Precision Electromagnetic Measurements, 1988. CPEM 88 Digest. 1988 Conference on

Conference_Location :

Ibaraki, Japan

Type :

conf

DOI :

10.1109/CPEM.1988.671324

Filename :

671324

Link To Document :