DocumentCode :
2909149
Title :
Improvement of CBE grown InGaAs/InP HBT´s using a carbon doped and compositionally graded base
Author :
Benchimol, J.L. ; Mba, J. ; Duchenois, A.M. ; Berdaguer, P. ; Sermage, B. ; Le Roux, G. ; Blayac, S. ; Riet, M. ; Thuret, J. ; Gonzalez, C. ; André, P.
Author_Institution :
Groupement d´´Interet Econ., OPTO+, Marcoussis, France
fYear :
1999
fDate :
1999
Firstpage :
559
Lastpage :
562
Abstract :
InGaAs/lnP heterojunction bipolar transistors (HBT) with a carbon doped base are shown to have lower gain than those with Be doped base, partly because of lower electron lifetime. In order to keep advantage of the low diffusivity of carbon dopant, a composition graduality is introduced in the base, which significantly improves the current gain of HBT´s. This graduality also leads to some advantageous side effects such as higher doping levels, low base sheet resistance and constant gain over a four-decade current range, without degrading the lifetime of the device. Such structures were processed as single HBT devices with high frequency performances (ft=168 GHz), digital circuits (2:1 MUX) operating at 46 Gbit/s and phototransistors with 35 dB optical gain and 62 GHz optical cut-off frequency
Keywords :
III-V semiconductors; bipolar digital integrated circuits; carbon; carrier lifetime; chemical beam epitaxial growth; gallium arsenide; heterojunction bipolar transistors; indium compounds; millimetre wave bipolar transistors; phototransistors; semiconductor doping; semiconductor growth; 168 GHz; 35 dB; 46 Gbit/s; 62 GHz; C diffusivity; CBE grown InGaAs/InP HBT; InGaAs-InP; InGaAs:C; base sheet resistance; carbon doped base; compositionally graded base; current gain; device lifetime; digital circuits; doping levels; electron lifetime; gain; heterojunction bipolar transistors; high frequency performances; optical cut-off frequency; optical gain; phototransistors; Cutoff frequency; Degradation; Digital circuits; Doping; Electrons; Heterojunction bipolar transistors; Indium gallium arsenide; Indium phosphide; Optical devices; Phototransistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 1999. IPRM. 1999 Eleventh International Conference on
Conference_Location :
Davos
ISSN :
1092-8669
Print_ISBN :
0-7803-5562-8
Type :
conf
DOI :
10.1109/ICIPRM.1999.773756
Filename :
773756
Link To Document :
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