• DocumentCode
    2909167
  • Title

    Composition dependence of carrier lifetime and spontaneous emission of highly strained GaInNAs/GaAs QW lasers

  • Author

    Koyama, F. ; Sato, S. ; Miyamoto, T. ; Iga, K.

  • Author_Institution
    Precision & Intelligence Lab., Tokyo Inst. of Technol., Yokohama, Japan
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    565
  • Lastpage
    568
  • Abstract
    The GaInNAs/GaAs system has been attracting much interest for 1.3 μm monolithic vertical cavity surface emitting lasers (VCSELs). So far, room temperature operations of 1.3 μm GaInNAs/GaAs edge emitting lasers grown by either gas source MBE or MOCVD have been demonstrated. However, the degradation of crystal qualities with increasing the nitrogen composition is a remaining problem. The origin for the deterioration is still unclear. It is essential to find the origin and to improve the quality of GaInNAs for realizing high performance long wavelength GaInNAs lasers. In this work, we present the composition dependence of emission characteristics of highly strained GaInNAs quantum well lasers, including the carrier lifetime, the spontaneous emission efficiency and the threshold current density. A prospect of long wavelength GaInNAs VCSELs for high speed LANs is also discussed
  • Keywords
    III-V semiconductors; carrier lifetime; gallium arsenide; indium compounds; quantum well lasers; semiconductor quantum wells; spontaneous emission; surface emitting lasers; 1.3 mum; 300 K; GaInNAs-GaAs; GaInNAs/GaAs; N content dependence; carrier lifetime; composition dependence; crystal qualities degradation; edge emitting lasers; highly strained QW lasers; long wavelength lasers; monolithic VCSELs; monolithic vertical cavity surface emitting lasers; room temperature operation; spontaneous emission; threshold current density; Charge carrier lifetime; Degradation; Gallium arsenide; Gas lasers; MOCVD; Quantum well lasers; Spontaneous emission; Surface emitting lasers; Temperature; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1999. IPRM. 1999 Eleventh International Conference on
  • Conference_Location
    Davos
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-5562-8
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1999.773758
  • Filename
    773758