Title :
A Two-Pass Diagnosis Method for Accurately Locating Logic Faults in VLSI Circuits
Author :
Vohra, Fazela ; Gui, Ping ; Zhou, Carl
Author_Institution :
Southern Methodist Univ., Dallas
Abstract :
In this paper, we present a two-pass approach for digital circuit fault diagnosis. By using the two-pass diagnosis method we can significantly improve the logic fault diagnostic resolution while keeping the test cost manageable. We performed fault diagnostic simulations on dozens of ISCAS89, ITC99, and other benchmark circuits and we are able to narrow down the list of likely faults to a single fault or multiple equivalent faults that are indistinguishable from each other.
Keywords :
VLSI; fault diagnosis; logic design; logic testing; ISCAS89; ITC99; VLSI circuits; digital circuit fault diagnosis; logic faults; two-pass diagnosis method; Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Costs; Digital circuits; Fault diagnosis; Logic circuits; Logic testing; Very large scale integration;
Conference_Titel :
Integrated Circuits, 2007. ISIC '07. International Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-0797-2
Electronic_ISBN :
978-1-4244-0797-2
DOI :
10.1109/ISICIR.2007.4441846
