Title :
Radiation Damage Analysis of a commercial optical CMOS Image Sensor
Author :
Vodnala, Preeti ; Haji-Sheikh, Micheal ; Lurio, Lawrence
Author_Institution :
Northern Illinois Univ., DeKalb
Abstract :
Detectors used with an intense radiation source, such as synchrotron require the need to study the damage which has occurred to the detector. This paper concentrates on understanding the effect of radiation damage on signal quality and examines a method to reduce such a damage.
Keywords :
CMOS image sensors; radiation detection; radiation effects; intense radiation source; optical CMOS image sensor; radiation damage analysis; signal quality; synchrotron; CMOS image sensors; Cameras; Clocks; Dark current; Image analysis; Optical sensors; Radiation detectors; Synchrotron radiation; Temperature; X-ray detection; CMOS image sensor; XPCS; dark current;
Conference_Titel :
Instrumentation and Measurement Technology Conference Proceedings, 2007. IMTC 2007. IEEE
Conference_Location :
Warsaw
Print_ISBN :
1-4244-0588-2
DOI :
10.1109/IMTC.2007.379023
