Title :
The Virtual Test program (VTest)
Author :
Dearborn, W.R. ; Perkins, Edward G. ; Wong, Joseph J. ; Rolince, David
Author_Institution :
Lockheed Martin Fed. Syst., Owego, NY, USA
Abstract :
The purpose of the USAF´s Research Laboratory´s Virtual Test (VTest) Program is to develop methodologies and software tools that permit the design, capture, and simulation of tester independent test requirements, Unit Under Test(UUT) models, and tester resource description information for the purpose of virtual testing. The program has resulted in a set of Integrated Commercial Off-The-Shelf(COTS) tools that reuse design simulation models developed for Electronic Design Automation (EDA) tools for test simulation on new digital Printed Circuit Boards (PCBs) and Assemblies (PCAs) and to significantly reduce model development on current digital PCAs. EDA derived tools are used to lay out and simulate a virtual test schematic (includes models of the UUT and tester environment) for the development of fully simulated analog/mixed signal Test Program Sets (TPSs), thereby significantly reducing analog/mixed signal TPS test integration times. Observed savings for various portions of the TPS development process vary from 24% for New Design Digital TPSs to 85% for Rehost of Analog TPSs
Keywords :
analogue circuits; automatic test software; design for testability; digital simulation; mixed analogue-digital integrated circuits; printed circuit design; software tools; USAF; analog/mixed signal test program sets; current digital PCA; digital printed circuit boards; electronic design automation; integrated commercial off-the-shelf tools; model development; reuse design simulation models; simulation; software tools; tester resource description; tools; virtual test schematic; virtual testing; Automatic testing; Circuit simulation; Circuit testing; Digital printing; Electronic design automation and methodology; Electronic equipment testing; Laboratories; Principal component analysis; Software testing; Software tools;
Conference_Titel :
AUTOTESTCON '98. IEEE Systems Readiness Technology Conference., 1998 IEEE
Conference_Location :
Salt Lake City, UT
Print_ISBN :
0-7803-4420-0
DOI :
10.1109/AUTEST.1998.713435