Title :
Design of an electronic charged particle spectrometer for measuring (/spl rho/R), yield, and implosion symmetry on the OMEGA Upgrade
Author :
Hicks, D.G. ; Li, C.K. ; Petrasso, R.D. ; Seguin, F.H. ; Knauer, J.P. ; Cremer, S. ; Kremens, R.L.
Author_Institution :
Plasma Fusion Center, MIT, Cambridge, MA, USA
Abstract :
Summary form only given, as follows. The design and fabrication of a state-of-the-art diagnostic that measures a broad energy spectrum of charged particles generated from targets irradiated by the OMEGA laser facility are actively underway. Using a set of CCDs and a 0.7-tesla permanent magnet, the diagnostic will uniquely determine particle identities and energies from /spl sim/1 MeV up to the maximum relevant for each particle type (10.6 MeV for tritons, 12.5 MeV for deuterons, and 31 MeV for protons). With its high density of picture elements (each CCD has 10/sup 6/ pixels), the spectrometer has a dynamic range of 1 to 10/sup 5/ particles/shot. For example, in the case of a DT yield of 10/sup 10/ neutrons, about 100 knock-on charged particles will be detected when the spectrometer aperture is 60 cm from the implosion. The measurement of knock-on D and T spectra will allow /spl rho/R´up to 0.15 g/cm/sup 2/ to be measured for a 1 keV plasma without hydrogen doping, or 0.3 g/cm/sup 2/ if hydrogen doping is used. The implosion and burn symmetry can be determined by using two such spectrometers to measure the yield and spectra on widely separated ports. Details on the spectrometer will be presented.
Keywords :
plasma diagnostics; /spl rho/R measurement; 0.7 tesla; 10.6 MeV; 12.5 MeV; 31 MeV; OMEGA Upgrade; OMEGA laser facility; broad energy spectrum; charged particles; electronic charged particle spectrometer; implosion symmetry; irradiated targets; particle energies; particle identities; plasma; state-of-the-art diagnostic; Current measurement; Doping; Energy measurement; Hydrogen; Optical design; Optical device fabrication; Particle measurements; Permanent magnets; Plasma measurements; Spectroscopy;
Conference_Titel :
Plasma Science, 1996. IEEE Conference Record - Abstracts., 1996 IEEE International Conference on
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-3322-5
DOI :
10.1109/PLASMA.1996.550245