DocumentCode :
2909349
Title :
Process variability characterization and interconnect modeling
Author :
Yuhua Cheng
fYear :
2005
fDate :
18-21 Sept. 2005
Firstpage :
586
Lastpage :
587
Keywords :
Circuit testing; Data analysis; Frequency; Integrated circuit interconnections; MOSFETs; Propagation delay; Semiconductor device measurement; Semiconductor device modeling; Size measurement; Varactors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 2005. Proceedings of the IEEE 2005
Print_ISBN :
0-7803-9023-7
Type :
conf
DOI :
10.1109/CICC.2005.1568737
Filename :
1568737
Link To Document :
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