Title :
Process variability characterization and interconnect modeling
Keywords :
Circuit testing; Data analysis; Frequency; Integrated circuit interconnections; MOSFETs; Propagation delay; Semiconductor device measurement; Semiconductor device modeling; Size measurement; Varactors;
Conference_Titel :
Custom Integrated Circuits Conference, 2005. Proceedings of the IEEE 2005
Print_ISBN :
0-7803-9023-7
DOI :
10.1109/CICC.2005.1568737
