DocumentCode :
2909465
Title :
Integrating COTS VXI hardware and software for the Marine Corps third echelon test system
Author :
Zeger, Randy ; Annese, Pat ; Cadogan, Margaret
Author_Institution :
ManTech Syst. Eng. Corp., Chantilly, VA, USA
fYear :
1998
fDate :
24-27 Aug 1998
Firstpage :
210
Lastpage :
215
Abstract :
This paper presents an overview of the Marine Corps´ new third echelon test system (TETS) and describes the work done by ManTech and Teradyne to integrate a standard-based tester able to withstand the unique challenges of the Marine Corps´ environment. The focus of the paper is on the integration efforts by ManTech and Teradyne in the critical areas of power and cooling design, subject to the system constraints of size, weight, and operating environment. It details other aspects of the integration effort, including tradeoffs in component selection, hardware integration, and mechanical design for a ruggedized environment. The paper will also discuss how the use of standards such as VXI facilitated the integration of a large number of components from a variety of suppliers. Power and cooling design will be explored at the system level, along with a more focused look at the power and cooling requirements for the TETS digital subsystem. The paper also describes the rigorous testing environment that was part of the system evaluation process. The conclusion summarizes the challenges of integrating COTS test hardware and software while adhering to the strict requirements of the target environment, and describe power and cooling techniques that can be applied in a variety of system integration applications
Keywords :
automatic testing; cooling; marine systems; military standards; military systems; peripheral interfaces; COTS VXI hardware; COTS VXI software; ManTech; Marine Corps; Teradyne; component selection; cooling design; digital subsystem; hardware integration; mechanical design; operating environment; rigorous testing environment; ruggedized environment; standard-based tester; system constraints; system evaluation process; system integration applications; third echelon test system; Cooling; Costs; Hardware; Instruments; Power system reliability; Radio frequency; Signal generators; Software testing; System testing; Systems engineering and theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '98. IEEE Systems Readiness Technology Conference., 1998 IEEE
Conference_Location :
Salt Lake City, UT
ISSN :
1088-7725
Print_ISBN :
0-7803-4420-0
Type :
conf
DOI :
10.1109/AUTEST.1998.713446
Filename :
713446
Link To Document :
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