Title :
Mixed-signal, 275 /spl deg/C instrumentation amplifier in bulk CMOS
Author :
Yu, Xinyu ; Garverick, Steven L.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Case Western Reserve Univ., Cleveland, OH
Abstract :
A precision, mixed-signal amplifier uses correlated double sampling, a mixed-signal tracking loop, and constant-gm biasing, and provides both analog and digital outputs. Its integrated g m/C oscillator has a frequency stability of 8 ppm/degC from 25-200 degC. A fully differential opamp has a gain-bandwidth of ~30 MHz and open-loop gain that varies by just 1 dB from 25-200 degC. The overall instrumentation amplifier has selectable voltage gain up to 192 and stable performance to 275 degC
Keywords :
CMOS integrated circuits; VHF amplifiers; frequency stability; instrumentation amplifiers; mixed analogue-digital integrated circuits; operational amplifiers; oscillators; signal sampling; 1 dB; 25 to 200 C; 275 C; analog outputs; bulk CMOS; correlated double sampling; digital outputs; frequency stability; fully differential opamp; gain bandwidth; instrumentation amplifier; integrated oscillator; mixed-signal amplifier; mixed-signal tracking loop; open-loop gain; Circuits; Clocks; Differential amplifiers; Frequency; Instruments; Oscillators; Parasitic capacitance; Temperature; Tracking loops; Transconductance;
Conference_Titel :
Custom Integrated Circuits Conference, 2005. Proceedings of the IEEE 2005
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-9023-7
DOI :
10.1109/CICC.2005.1568751
