Title :
Using pass/fail limits as a diagnostic tool
Author_Institution :
Deep Creek Technol. Inc., USA
Abstract :
This paper addresses the improvement of diagnostic resolution by judicious selection of pass/fail limits. Emphasis is placed on the use of pass/fail limits to discriminate among suspected failures in a known faulty circuit and increase test outcome confidence. Analog circuit simulations serve to illustrate the relationship between failed circuit behavior, pass/fail limits and the associated diagnostic inferences. Interim findings included here were presented at the IEEE International Workshop on System Test and Diagnosis. These findings have been updated to include results from application to a large scale project
Keywords :
analogue circuits; automatic test equipment; circuit simulation; circuit testing; failure analysis; fault diagnosis; probability; IEEE; UUT; analog circuit simulation; binary tests; diagnostic inferences; diagnostic resolution; fault isolation; large scale project; pass/fail limits; tertiary tests; Analog circuits; Assembly; Circuit faults; Circuit testing; Electrical fault detection; Electronic equipment testing; Fault detection; Logic testing; Propulsion; Voltage;
Conference_Titel :
AUTOTESTCON '98. IEEE Systems Readiness Technology Conference., 1998 IEEE
Conference_Location :
Salt Lake City, UT
Print_ISBN :
0-7803-4420-0
DOI :
10.1109/AUTEST.1998.713460
