Title :
Easily testable multiple-valued cellular arrays
Author :
Kamiura, Naotake ; Hata, Yutaka ; Miyawaki, Fujio ; Yamato, Kazuharu
Author_Institution :
Fac. of Eng., Himeji Inst. of Technol., Japan
Abstract :
An easily testable k-valued cellular array consisting of input arrays and a control array that requires fewer cells than other methods is proposed. Stuck-at, open, and AND bridging faults are treated under the assumption that a single fault occurs in the array. Test input vectors can be easily generated from control inputs that specify the switches of cells. It is shown that a faulty cell can be effectively diagnosed by using several observable terminals and (k+1)-valued logic values
Keywords :
cellular arrays; logic testing; many-valued logics; AND bridging faults; control array; easily testable; faulty cell; input arrays; multiple-valued cellular arrays; observable terminals; stuck-at faults; stuck-open faults; test input vectors; Circuit faults; Circuit testing; Costs; Logic arrays; Logic circuits; Logic design; Logic functions; Logic testing; Multivalued logic; Switches;
Conference_Titel :
Multiple-Valued Logic, 1992. Proceedings., Twenty-Second International Symposium on
Conference_Location :
Sendai
Print_ISBN :
0-8186-2680-1
DOI :
10.1109/ISMVL.1992.186775
