DocumentCode :
2909979
Title :
Combined Synthesis of Easily Testable Datapath and Control Designs
Author :
Mitra, Blswadip ; Chaundhuri, P.P.
Author_Institution :
Texas Instruments (India) Ltd
fYear :
1992
fDate :
4-7 Jan 1992
Firstpage :
187
Lastpage :
192
Keywords :
Automatic control; Automatic testing; Control design; Control system synthesis; Instruments; Logic design; Logic testing; Scheduling algorithm; Stochastic processes; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 1992. Proceedings., The Fifth International Conference on
ISSN :
1063-9667
Print_ISBN :
0-8186-2465-5
Type :
conf
DOI :
10.1109/ICVD.1992.658045
Filename :
658045
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2909979
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