Error Modeling of a Fast Digital Integrator for Magnetic Measurements at CERN

Author

Arpaia, P. ; Inglese, Vitaliano ; Spiezia, Giovanni ; Tiso, Stefano

Author_Institution

Univ. of Sannio, Benevento

fYear

2007

fDate

1-3 May 2007

Firstpage

1

Lastpage

6

Abstract

A statistical behavioral modeling approach for assessing dynamic metrological performance during the concept design of accurate digitizers is proposed. A surface-response approach based on statistical experiment design is exploited in order to avoid unrealistic hypothesis of linearity, optimize simulation effort, explore systematically operating conditions, and verify identification and validation uncertainty. An actual case study on the dynamic metrological characterization of a fast digital integrator for high-performance magnetic measurements at European Organization for Nuclear Research (CERN) is presented.

Keywords

analogue-digital conversion; integrating circuits; magnetic variables measurement; nuclear instrumentation; statistical analysis; CERN; European Organization for Nuclear Research; analog-to-digital converter; digital integrator; dynamic metrological characterization; error modeling; magnetic measurements; statistical behavioral modeling approach; statistical experiment design; surface-response approach; Analog-digital conversion; Design optimization; Error analysis; Instrumentation and measurement; Instruments; Linearity; Magnetic analysis; Magnetic variables measurement; Statistical analysis; Uncertainty; Analog-to-digital converter (ADC); error analysis; modeling; statistics;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference Proceedings, 2007. IMTC 2007. IEEE

Conference_Location

Warsaw

ISSN

1091-5281

Print_ISBN

1-4244-0588-2

Type

conf

DOI

10.1109/IMTC.2007.379048

Filename

4258180