Title :
Reliability comparison for 3L-NPC and 3L-ANPC converters for drives application
Author :
Li, Jun ; Englebretson, Steven ; Huang, Alex Q.
Author_Institution :
ABB Corp. Res. Center, Raleigh, NC, USA
Abstract :
Compared with NPC converters, Active NPC (ANPC) converters improve the loss distribution among semiconductor devices and thus increase the converter output power rating and switching frequency. However, since more switches with their gate drivers are used in ANPC converters, the impact on the converter reliability is one of the main concerns for drives application. In this paper, the analysis on fault tolerant operation of 3L-ANPC converters under single and multiple device failure conditions is presented. Furthermore, the methodology for reliability function calculation and the reliability comparison of 3L-ANPC and 3L-NPC converters are investigated for drives application. Finally, the results and conclusions are presented.
Keywords :
electric drives; failure analysis; fault tolerance; losses; power convertors; power semiconductor switches; 3L-ANPC converters; 3L-NPC convertors; device failure conditions; drives; fault tolerant; gate drivers; loss distribution; reliability; semiconductor devices; switches; Circuit faults; Fault tolerance; Fault tolerant systems; Integrated circuit reliability; Modulation; Switches; 3L-ANPC; 3L-NPC; device failure; fault tolerant; motor drive; reliability;
Conference_Titel :
Electric Machines & Drives Conference (IEMDC), 2011 IEEE International
Conference_Location :
Niagara Falls, ON
Print_ISBN :
978-1-4577-0060-6
DOI :
10.1109/IEMDC.2011.5994858