Title :
Dynamic current-mode multi-valued MOS memory with error correction
Author :
Lee, Edward K F ; Gulak, P. Glenn
Author_Institution :
Dept. of Electr. Eng., Toronto Univ., Ont., Canada
Abstract :
The design of a dynamic current-mode multivalued MOS memory, with error correction used to increase the noise margins, is presented. It is based on the current-copier and single-slope analog-to-digital conversion techniques. The noise margin of the multivalued stored data is increased by storing and comparing the least significant bits of its binary representation during each refresh cycle. Alternatively, the number of bits of precision can be increased for a given noise margin. Furthermore, this technique provides a design trade-off between noise margin and implementation area
Keywords :
MOS integrated circuits; analogue-digital conversion; emitter-coupled logic; error correction; integrated logic circuits; integrated memory circuits; many-valued logics; binary representation; current-copier; design trade-off; dynamic current mode multivalued MOS memory; error correction; noise; refresh cycle; single-slope analog-to-digital conversion; Circuit noise; Error correction; Multivalued logic; Noise level; Noise reduction; Power supplies; Quantization; Random access memory; Switches; Voltage;
Conference_Titel :
Multiple-Valued Logic, 1992. Proceedings., Twenty-Second International Symposium on
Conference_Location :
Sendai
Print_ISBN :
0-8186-2680-1
DOI :
10.1109/ISMVL.1992.186797
