DocumentCode
2910351
Title
Thermal energy emission diagnostics enhancement to the advanced power supply test system
Author
Wenzel, Dennis ; Bernal, Ashley ; Burris, Daniel ; Dalton, Aaron M.
Author_Institution
Eng. Spectrum Inc., San Antonio, TX, USA
fYear
1998
fDate
24-27 Aug 1998
Firstpage
572
Lastpage
579
Abstract
The Advanced Power Supply Test Station (APSTS) is a system used for automated power supply testing. The capabilities of this system have been enhanced by the development and integration of a Thermal Diagnostic Instrument to provide thermal energy emission diagnostics. Thermal images of a power supply circuit board are acquired at intervals during initial power-on. A projective mapping technique based on geometric image warping is used to locate individual components in these images given arbitrary alignment between the board and the imager. A unique energy ratio calculation is used to normalize the effects of emissivity in the measured thermal values for each component. A fuzzy logic expert system and an artificial neural network are used to compute likelihood of failure estimates from these energy ratio values. Fuzzy logic membership functions are based on experimental data from normal and failed circuit boards, and rules are based on the knowledge of the board circuits
Keywords
automatic test equipment; diagnostic expert systems; emissivity; fault location; fuzzy logic; infrared imaging; neural nets; power supply circuits; printed circuit testing; ANN; advanced power supply test system; artificial neural network; automated power supply testing; emissivity correction; energy ratio calculation; failure estimates likelihood computation; fuzzy logic expert system; fuzzy logic membership functions; geometric image warping; power supply circuit board; projective mapping technique; thermal diagnostic instrument; thermal energy emission diagnostics; thermal images; Artificial neural networks; Automatic testing; Circuit testing; Energy measurement; Expert systems; Fuzzy logic; Instruments; Power supplies; Printed circuits; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '98. IEEE Systems Readiness Technology Conference., 1998 IEEE
Conference_Location
Salt Lake City, UT
ISSN
1088-7725
Print_ISBN
0-7803-4420-0
Type
conf
DOI
10.1109/AUTEST.1998.713499
Filename
713499
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