DocumentCode
2910523
Title
A survey of on-chip monitors
Author
Rahimipour, S. ; Flayyih, Wameedh N. ; El-Azhary, Ismail ; Shafie, Suhaidi ; Rokhani, Fakhrul Z.
Author_Institution
Dept. of Comput. & Commun. Syst. Eng., Univ. Putra Malaysia, Serdang, Malaysia
fYear
2012
fDate
3-4 Oct. 2012
Firstpage
243
Lastpage
248
Abstract
Systems on Chips (SoCs) architecture complexity is result of integrating a large numbers of cores in a single chip. The approaches should address the systems particular challenges such as reliability, performance, and power constraints. Monitoring became a necessary part for testing, debugging and performance evaluations of SoCs at run time, as On-chip monitoring is employed to provide environmental information, such as temperature, voltage, and error data. Real-time system validation is done by exploiting the monitoring to determine the proper operation of a system within the designed parameters. The paper explains the common monitoring operations in SoCs, showing the functionality of thermal, voltage and soft error monitors. The different architectures that are approached by the research community until now are discussed.
Keywords
integrated circuit reliability; integrated circuit testing; radiation hardening (electronics); real-time systems; system-on-chip; SoC architecture complexity; debugging evaluations; environmental information; on-chip monitoring; performance evaluations; real-time system validation; soft error monitoring; systems-on-chips architecture complexity; testing evaluation; thermal monitoring; voltage monitoring; Delay; Monitoring; Multicore processing; System-on-a-chip; Temperature measurement; Temperature sensors; Thermal management;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (ICCAS), 2012 IEEE International Conference on
Conference_Location
Kuala Lumpur
Print_ISBN
978-1-4673-3117-3
Electronic_ISBN
978-1-4673-3118-0
Type
conf
DOI
10.1109/ICCircuitsAndSystems.2012.6408286
Filename
6408286
Link To Document