Title :
Harnessing machine learning to improve the success rate of stimuli generation
Author :
Fine, Shai ; Freund, Ari ; Jaeger, Itai ; Naveh, Yehuda ; Ziv, Avi ; Mansour, Yishay
Author_Institution :
IBM Res. Lab., Haifa, Israel
fDate :
30 Nov.-2 Dec. 2005
Abstract :
The initial state of a design under verification has a major impact on the ability of stimuli generators to successfully generate the requested stimuli. For complexity reasons, most stimuli generators use sequential solutions without planning ahead. Therefore, in many cases they fail to produce consistent stimuli due to an inadequate selection of the initial state. We propose a method, based on machine learning techniques, to improve generation success by learning the relationship between the initial state vector and generation success. We applied the proposed method in two different settings, with the objective of improving generation success and coverage in processor and system level generation. In both settings, the proposed method significantly reduced generation failures and enabled faster coverage.
Keywords :
automatic test pattern generation; formal verification; learning (artificial intelligence); logic CAD; logic testing; generation failure reduction; initial state vector; machine learning; stimuli generation; system level generation; Computer science; Electronic mail; Event detection; Hardware; Laboratories; Law; Legal factors; Machine learning; Test pattern generators; Testing;
Conference_Titel :
High-Level Design Validation and Test Workshop, 2005. Tenth IEEE International
Print_ISBN :
0-7803-9571-9
DOI :
10.1109/HLDVT.2005.1568823