DocumentCode :
2910999
Title :
CA based implementation of March test for high speed memories
Author :
Saha, Mousumi ; Sikdar, B.K.
Author_Institution :
Dept. of Comput. Applic., Nat. Inst. of Technol., Durgapur, India
fYear :
2012
fDate :
3-4 Oct. 2012
Firstpage :
54
Lastpage :
58
Abstract :
This work proposes an efficient realization of March test for fault detection in high speed memories. The realization is based on the theory of a modeling tool called cellular automata (CA). A special class of CA architecture referred to as the SACA is considered for the test logic design. The test logic/hardware thus developed operates on the data read from the memory during March. It outputs an one-bit signature to detect faults in the memory chip, effectively reducing the comparison time required in conventional realization. The regular structure of CA enables low cost implementation of the test hardware for a memory chip, that is inherently regular in structure. The introduction of segmented CA structure further enables the drastic reduction in testing time.
Keywords :
cellular automata; logic design; logic testing; semiconductor storage; March test; SACA; cellular automata architecture; fault detection; high speed memory; memory chip; modeling tool; one-bit signature; test hardware; test logic design; testing time reduction; Automata; Built-in self-test; Lead; Logic design; Memory tests; SACA; cellular automata; fault detection; march tests;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ICCAS), 2012 IEEE International Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4673-3117-3
Electronic_ISBN :
978-1-4673-3118-0
Type :
conf
DOI :
10.1109/ICCircuitsAndSystems.2012.6408319
Filename :
6408319
Link To Document :
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