DocumentCode :
2911053
Title :
Structural Patterns for Soundness of Business Process Models
Author :
Van Dongen, Boudewijn F. ; Mendling, J. ; van der Aalst, Wil M. P.
Author_Institution :
Dept. of Technol. Manage., Eindhoven Univ. of Technol.
fYear :
2006
fDate :
Oct. 2006
Firstpage :
116
Lastpage :
128
Abstract :
The correctness of business process models is of paramount importance for the application on an enterprise level. A severe problem is that several languages for business process modelling do not have formal execution semantics which is a prerequisite to check correctness criteria. In this context, soundness defines a minimum correctness criterion that a process model should fulfil. In this paper we present a novel approach to reason about soundness based on so-called causal footprints. A causal footprint represents a set of conditions on the order of activities that holds for every case of a process model. We identify three kinds of error patterns that affect the soundness of a process model, namely the deadlock pattern, the multiple termination pattern, and the trap pattern. We use event-driven process chains (EPCs) and Petri nets to demonstrate the applicability of our approach for both conceptual as for formal process modelling languages. Furthermore, it can easily be applied to other languages, such as UML activity diagrams or BPEL. Based on the trap pattern, we prove that the "vicious circle", that is heavily discussed in EPC literature, is unsound
Keywords :
Petri nets; business data processing; corporate modelling; Petri nets; business process modelling; causal footprints; deadlock pattern; event-driven process chains; formal process modelling languages; minimum correctness criterion; multiple termination pattern; structural patterns; trap pattern; Context modeling; Engines; Large-scale systems; Pattern analysis; Petri nets; Runtime; State-space methods; System recovery; Technology management; Unified modeling language;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Enterprise Distributed Object Computing Conference, 2006. EDOC '06. 10th IEEE International
Conference_Location :
Hong Kong
ISSN :
1541-7719
Print_ISBN :
0-7695-2558-X
Type :
conf
DOI :
10.1109/EDOC.2006.56
Filename :
4031201
Link To Document :
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